Smart measurements are widely deployed in many applications due to the technology advancement. For various industrial applications, automated inspection and analysis based on the image is provided by machine vision. For the measurements in these applications, sensors must be connected. Machine vision tries to creatively combine already existing technology and use them to address current issues. The term "measurement" is frequently used to refer to many tasks and is the cornerstone of industrial automation and security deployment. This Special Issue of Instrumentation & Measurement Magazine addresses some novel achievements in the measurement and instrumentation science and technology fields. It advances machine vision concerning production, application of smart materials, measurement and estimation techniques, etc. The variety of selected papers reflects the efforts made by the authors to focus either on methodological aspects or technical issues. In particular, three papers have been accepted for publication, reflecting several aspects of the abovementioned fields by covering machine vision and image processing technology.
Guest Editorial: Smart Measurement in Machine Vision for Challenging Applications
Pelusi, D
2023-01-01
Abstract
Smart measurements are widely deployed in many applications due to the technology advancement. For various industrial applications, automated inspection and analysis based on the image is provided by machine vision. For the measurements in these applications, sensors must be connected. Machine vision tries to creatively combine already existing technology and use them to address current issues. The term "measurement" is frequently used to refer to many tasks and is the cornerstone of industrial automation and security deployment. This Special Issue of Instrumentation & Measurement Magazine addresses some novel achievements in the measurement and instrumentation science and technology fields. It advances machine vision concerning production, application of smart materials, measurement and estimation techniques, etc. The variety of selected papers reflects the efforts made by the authors to focus either on methodological aspects or technical issues. In particular, three papers have been accepted for publication, reflecting several aspects of the abovementioned fields by covering machine vision and image processing technology.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.